4RKK
Structure of a product bound phosphatase
X-RAY DIFFRACTION
Crystallization
Crystalization Experiments | ||||
---|---|---|---|---|
ID | Method | pH | Temperature | Details |
1 | VAPOR DIFFUSION, HANGING DROP | 5 | 277 | 250 mM maltohexaose, 0.19 M Sodium Acetate, 0.1 M Sodium Citrate, 25.5% PEG3350, 15% Glycerol, pH 5.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K |
2 | VAPOR DIFFUSION, HANGING DROP | 5 | 277 | 250 mM maltohexaose, 0.17 M Sodium Acetate, 0.08 M Sodium Citrate, 25.5% PEG4000, 15% Glycerol, 30 mM Sodium Tungstate, pH 5.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K |
Crystal Data
Unit Cell | |
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Length ( Å ) | Angle ( ˚ ) |
a = 78.706 | α = 90 |
b = 78.706 | β = 90 |
c = 321.124 | γ = 90 |
Symmetry | |
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Space Group | P 43 21 2 |
Diffraction
Diffraction Experiment | ||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
1 | 1 | x-ray | 100 | CCD | MARMOSAIC 300 mm CCD | 2013-06-07 | M | SINGLE WAVELENGTH | ||||||
2 | 2 | x-ray | M | SINGLE WAVELENGTH |
Radiation Source | |||||
---|---|---|---|---|---|
ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
1 | SYNCHROTRON | APS BEAMLINE 22-ID | 1.0000, 1.2148 | APS | 22-ID |
2 |
Data Collection
Overall | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | |||||||||
1,2 | 2.4 | 20 | 92.3 | 37585 | -3 |
Highest Resolution Shell | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | ||||||||||||
1,2 | 2.4 | 2.49 | 92 |
Refinement
Statistics | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B | |||||
X-RAY DIFFRACTION | SAD | THROUGHOUT | 2.4 | 19.98 | 33896 | 3582 | 91.97 | 0.17055 | 0.16634 | 0.18 | 0.21053 | 0.21 | RANDOM | 52.542 |
Temperature Factor Modeling | ||||||
---|---|---|---|---|---|---|
Anisotropic B[1][1] | Anisotropic B[2][2] | Anisotropic B[3][3] | ||||
-0.05 | -0.05 | 0.11 |
RMS Deviations | |
---|---|
Key | Refinement Restraint Deviation |
r_dihedral_angle_2_deg | 34.43 |
r_dihedral_angle_4_deg | 19.589 |
r_dihedral_angle_3_deg | 14.388 |
r_long_range_B_other | 9.316 |
r_long_range_B_refined | 9.311 |
r_scangle_other | 7.655 |
r_dihedral_angle_1_deg | 5.637 |
r_scbond_it | 5.235 |
r_scbond_other | 5.234 |
r_mcangle_it | 5.001 |
Non-Hydrogen Atoms Used in Refinement | |
---|---|
Non-Hydrogen Atoms | Number |
Protein Atoms | 5022 |
Nucleic Acid Atoms | |
Solvent Atoms | 144 |
Heterogen Atoms | 345 |
Software
Software | |
---|---|
Software Name | Purpose |
HKL-2000 | data collection |
PHENIX | model building |
REFMAC | refinement |
HKL-2000 | data reduction |
HKL-2000 | data scaling |
PHENIX | phasing |