5WJU

Cryo-EM structure of B. subtilis flagellar filaments A39V, N133H


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d3.601
f_angle_d0.876
f_chiral_restr0.046
f_bond_d0.005
f_plane_restr0.003
Sample
Bacillus subtilis flagella filament
Specimen Preparation
Sample Aggregation StateFILAMENT
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification Details
Staining TypeNEGATIVE
Staining Materialnegative stain
Staining Details
3D Reconstruction
Reconstruction MethodHELICAL
Number of Particles134766
Reported Resolution (Å)4.3
Resolution MethodOTHER
Other Detailsmodel-map FSC 0.38 cut-off
Refinement Type
Symmetry TypeHELICAL
Axial SymmetryC1
Axial Rise4.65
Angular Rotation65.81
Map-Model Fitting and Refinement
Id1
Refinement SpaceREAL
Refinement Protocol
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeFEI FALCON II (4k x 4k)
Electron Dose (electrons/Å**2)20
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)
Maximum Defocus (nm)
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeBRIGHT FIELD
Specimen Holder Model
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONEMAN2
IMAGE ACQUISITIONEPU
CTF CORRECTIONCTFFIND3
MODEL FITTINGRosetta
MODEL REFINEMENTPHENIX
MODEL REFINEMENTCoot
INITIAL EULER ASSIGNMENTSPIDER
FINAL EULER ASSIGNMENTSPIDER
CLASSIFICATIONSPIDER
RECONSTRUCTIONSPIDER
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION