6YXR

Dunaliella Minimal Photosystem I


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d30.3785
f_angle_d2.8402
f_chiral_restr0.2716
f_plane_restr0.0246
f_bond_d0.0213
Sample
Large dunaliella salina photosystem I-LHC supercomplex
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentLEICA EM GP
Cryogen NameETHANE
Sample Vitrification Details2.5 sec blotting before plunging
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles45969
Reported Resolution (Å)3.4
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Point SymmetryC1
Map-Model Fitting and Refinement
Id1
Refinement SpaceREAL
Refinement ProtocolAB INITIO MODEL
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å**2)42.68
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)900
Maximum Defocus (nm)3000
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeBRIGHT FIELD
Specimen Holder Model
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONRELION3.0.7
IMAGE ACQUISITIONEPU
CTF CORRECTIONCTFFIND4.1
MODEL FITTINGPHENIX
MODEL REFINEMENTPHENIX
INITIAL EULER ASSIGNMENTRELION3.0.7
FINAL EULER ASSIGNMENTRELION3.0.7
CLASSIFICATIONRELION3.0.7
RECONSTRUCTIONRELION3.0.7
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
NONE720711