4IXR
RT fs X-ray diffraction of Photosystem II, first illuminated state
X-RAY DIFFRACTION
Starting Model(s)
Initial Refinement Model(s) | |||
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Type | Source | Accession Code | Details |
experimental model | PDB | 3BZ1 | PDB ENTRY 3BZ1 |
Crystallization
Crystalization Experiments | ||||
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ID | Method | pH | Temperature | Details |
1 | BATCH | 7 | 298 | 4% PEG2000, 5 mM calcium chloride, 100 mM PIPES, pH 7.0, BATCH, temperature 298K |
Crystal Properties | |
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Matthews coefficient | Solvent content |
3.66 | 66.38 |
Crystal Data
Unit Cell | |
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Length ( Å ) | Angle ( ˚ ) |
a = 131.976 | α = 90 |
b = 227.568 | β = 90 |
c = 306.994 | γ = 90 |
Symmetry | |
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Space Group | P 21 21 21 |
Diffraction
Diffraction Experiment | ||||||||||||||
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ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
1 | 1 | x-ray | 298 | PIXEL | Cornell-SLAC Pixel Array Detector (CSPAD) | KB mirrors | 2011-12-06 | M | SINGLE WAVELENGTH |
Radiation Source | |||||
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ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
1 | FREE ELECTRON LASER | SLAC LCLS BEAMLINE CXI | 1.2967, 1.7547 | SLAC LCLS | CXI |
Data Collection
Overall | |||||||||||||||||||
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | |||||||||
1 | 5.9 | 83 | 98.5 | 22.1 | 22.9 | 25059 | 24671 | 4.2 |
Highest Resolution Shell | |||||||||||||||||||
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | ||||||||||||
1 | 5.9 | 6.1364 | 88 | 4.2 | 4 |
Refinement
Statistics | |||||||||||||||||||
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Diffraction ID | Structure Solution Method | Starting model | Resolution (High) | Resolution (Low) | Cut-off Sigma (I) | Cut-off Sigma (F) | Number Reflections (All) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B | ||
X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | PDB ENTRY 3BZ1 | 5.9 | 82.97 | 4.2 | 1.4 | 25059 | 24668 | 1200 | 98.44 | 0.286 | 0.2846 | 0.28 | 0.3132 | 0.31 | FROM PDB ENTRY 3BZ1, EXPANDED TO INCLUDE 5% OF REFLECTIONS |
RMS Deviations | |
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Key | Refinement Restraint Deviation |
f_dihedral_angle_d | 18.513 |
f_angle_d | 1.025 |
f_chiral_restr | 0.052 |
f_bond_d | 0.005 |
f_plane_restr | 0.005 |
Non-Hydrogen Atoms Used in Refinement | |
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Non-Hydrogen Atoms | Number |
Protein Atoms | 41050 |
Nucleic Acid Atoms | |
Solvent Atoms | |
Heterogen Atoms | 9182 |
Software
Software | |
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Software Name | Purpose |
PHASER | phasing |
PHENIX | refinement |
cctbx.xfel | data reduction |