1CZB
ATOMIC RESOLUTION ASV INTEGRASE CORE DOMAIN FROM HEPES
X-RAY DIFFRACTION
Crystallization
Crystalization Experiments | ||||
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ID | Method | pH | Temperature | Details |
1 | VAPOR DIFFUSION, HANGING DROP | 7.5 | 277 | 20% PEG 4000, 10% ISOPROPANOL, 100 mM HEPES pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 277K |
Crystal Properties | |
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Matthews coefficient | Solvent content |
2.4 | 48.67 |
Crystal Data
Unit Cell | |
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Length ( Å ) | Angle ( ˚ ) |
a = 65.37 | α = 90 |
b = 65.37 | β = 90 |
c = 80.14 | γ = 90 |
Symmetry | |
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Space Group | P 43 21 2 |
Diffraction
Diffraction Experiment | ||||||||||||||
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ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
1 | 1 | x-ray | 95 | IMAGE PLATE | MARRESEARCH | 1998-03-21 | M | SINGLE WAVELENGTH |
Radiation Source | |||||
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ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
1 | SYNCHROTRON | NSLS BEAMLINE X9B | NSLS | X9B |
Data Collection
Overall | |||||||||||||||||||
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||||
1 | 1.06 | 15 | 90.01 | 0.034 | 32.3 | 3.6 | 69419 | 69419 | -3 | 15.2 |
Highest Resolution Shell | |||||||||||||||||||
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | ||||||||||||
1.06 | 1.08 | 86.7 | 4.2 | 2467 |
Refinement
Statistics | |||||||||||||||||||
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Diffraction ID | Structure Solution Method | Resolution (High) | Resolution (Low) | Number Reflections (All) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (All) | R-Factor (Observed) | R-Work | R-Free | R-Free Selection Details | Mean Isotropic B | ||||||
X-RAY DIFFRACTION | AB INITIO | 1.06 | 10 | 74543 | 74543 | 1490 | 94.4 | 0.143 | 0.143 | 0.1433 | 0.1639 | random |
Temperature Factor Modeling | ||||||
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Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
Coordinate Error | ||
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Structure Solution Method | Refinement High Resolution | Refinement Low Resolution |
1 | 1001 | 1189 |
RMS Deviations | |
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Key | Refinement Restraint Deviation |
s_from_restr_planes | 0.347 |
s_non_zero_chiral_vol | 0.098 |
s_zero_chiral_vol | 0.083 |
s_approx_iso_adps | 0.068 |
s_similar_adp_cmpnt | 0.046 |
s_angle_d | 0.031 |
s_similar_dist | 0.024 |
s_bond_d | 0.016 |
s_rigid_bond_adp_cmpnt | 0.006 |
Non-Hydrogen Atoms Used in Refinement | |
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Non-Hydrogen Atoms | Number |
Protein Atoms | 1131 |
Nucleic Acid Atoms | |
Solvent Atoms | 137 |
Heterogen Atoms | 15 |
Software
Software | |
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Software Name | Purpose |
X-PLOR | model building |
SHELXL | refinement |
MAR345 | data collection |
SCALEPACK | data scaling |
X-PLOR | phasing |