3L00
Crystal structure of benzylated SNAP-tag
X-RAY DIFFRACTION
Starting Model(s)
Initial Refinement Model(s) | |||
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Type | Source | Accession Code | Details |
experimental model | PDB | 3KZY | PDB ENTRY 3KZY |
Crystallization
Crystalization Experiments | ||||
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ID | Method | pH | Temperature | Details |
1 | VAPOR DIFFUSION, HANGING DROP | 6.5 | 291 | 34% PEG 3350, 100mM BisTris pH 6.5, 400mM NaCl , VAPOR DIFFUSION, HANGING DROP, temperature 291K |
Crystal Properties | |
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Matthews coefficient | Solvent content |
2.51 | 51.03 |
Crystal Data
Unit Cell | |
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Length ( Å ) | Angle ( ˚ ) |
a = 77.77 | α = 90 |
b = 77.77 | β = 90 |
c = 64.88 | γ = 90 |
Symmetry | |
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Space Group | P 43 2 2 |
Diffraction
Diffraction Experiment | ||||||||||||||
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ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
1 | 1 | x-ray | 100 | CCD | MAR CCD 165 mm | 2009-01-29 | M | SINGLE WAVELENGTH |
Radiation Source | |||||
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ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
1 | SYNCHROTRON | ESRF BEAMLINE BM30A | 0.979653 | ESRF | BM30A |
Data Collection
Overall | |||||||||||||||||||
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||||
1 | 1.7 | 50 | 99.42 | 0.073 | 21.59 | 7.6 | 22595 | 22465 | 25.794 |
Highest Resolution Shell | |||||||||||||||||||
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | |||||||||||
1.7 | 1.8 | 97.8 | 0.367 | 4.68 | 7.59 | 3492 |
Refinement
Statistics | |||||||||||||||||||
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Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Number Reflections (All) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B | |||
X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | THROUGHOUT | PDB ENTRY 3KZY | 1.7 | 33.35 | 22434 | 21312 | 1122 | 100 | 0.18509 | 0.18383 | 0.19 | 0.20917 | 0.22 | RANDOM | 20.524 |
RMS Deviations | |
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Key | Refinement Restraint Deviation |
r_dihedral_angle_2_deg | 38.659 |
r_dihedral_angle_4_deg | 18.892 |
r_dihedral_angle_3_deg | 12.724 |
r_dihedral_angle_1_deg | 5.877 |
r_scangle_it | 3.011 |
r_scbond_it | 1.874 |
r_angle_refined_deg | 1.311 |
r_mcangle_it | 1.212 |
r_mcbond_it | 0.656 |
r_chiral_restr | 0.086 |
Non-Hydrogen Atoms Used in Refinement | |
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Non-Hydrogen Atoms | Number |
Protein Atoms | 1215 |
Nucleic Acid Atoms | |
Solvent Atoms | 186 |
Heterogen Atoms | 1 |
Software
Software | |
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Software Name | Purpose |
CCP4 | model building |
REFMAC | refinement |
XDS | data reduction |
XDS | data scaling |
CCP4 | phasing |